Aehr Test Systems Insider Sold Shares Worth $2,125,000, According to a Recent SEC Filing – Charm

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Published on 04/20/2026
at 03:30 am EDT

MT Newswires

03:30am	Aehr Test Systems Insider Sold Shares Worth $2,125,000, According to a Recent SEC Filing	MT
Apr. 17	Aehr Test Systems Insider Sold Shares Worth $1,210,800, According to a Recent SEC Filing	MT
Apr. 16	Top Midday Gainers	MT
Apr. 16	Aehr Test Systems Receives $41 Million Production Order From Hyperscale AI Customer	MT
Apr. 15	Aehr Test Systems Insider Sold Shares Worth $385,731, According to a Recent SEC Filing	MT
Apr. 15	Aehr Test Systems Insider Sold Shares Worth $1,244,804, According to a Recent SEC Filing	MT
Apr. 13	Aehr Test Systems Insider Sold Shares Worth $2,373,250, According to a Recent SEC Filing	MT
Apr. 13	Aehr Test Systems Insider Sold Shares Worth $1,081,856, According to a Recent SEC Filing	MT
Apr. 09	Exchange-Traded Funds, Equity Futures Lower Pre-Bell Thursday as Fragile Middle East Ceasefire Lifts Oil Prices	MT
Apr. 09	Aehr Test Systems Establishes $60 Million At-The-Market Offering Program	MT
Apr. 08	Aehr Test Systems entered into equity distribution agreement with William Blair & Company & Craig-Hallum Capital Group	RE
Apr. 08	Aehr Test Systems Shares Rise After Posting Fiscal Q3 Adjusted Loss Narrower Than Consensus	MT
Apr. 07	Aehr Test Systems, Inc., Q3 2026 Earnings Call, Apr 07, 2026
Apr. 07	Aehr Test Systems Changes Its Fiscal Year End from the 52- or 53-Week Period Ending May 31 to the 52- or 53-Week Period Ending June 30	CI
Apr. 07	Aehr Test Systems, Inc. Reports Earnings Results for the Third Quarter and Nine Months Ended February 27, 2026	CI

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Aehr Test Systems, Inc. offers test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and package part form. Its products include the FOX-P family of test and burn-in systems and FOX WaferPak Aligner, FOX WaferPak Contactor, FOX DiePak Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems that can test, burn-in and stabilize a range of devices such as silicon carbide-based and other power semiconductors, 2D and 3D sensors used in phones, tablets and other computing devices. FOX-CP system is a single-wafer compact test solution for logic, memory and photonic devices. FOX WaferPak Contactor contains a full wafer contactor capable of testing wafers up to 300 millimeters that enables integrated circuit manufacturers to perform testing, burn-in and stabilization of full wafers on the FOX-P systems. It offers packaged part reliability/burn-in test solutions.